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Advances in In-Situ Microscopy
Start Date: 10/4/2017Start Time: 8:00 AM
End Date: 10/4/2017End Time: 5:00 PM

Event Description
Advances in In-Situ Microscopy: Addressing In-Situ TEM Challenges Using Integrated Hardware and Software
This intensive workshop sponsored by Gatan, JEOL, Oxford, and DENSsolutions at Drexel University will present and demonstrate state-of-the-art instruments and software for in-situ electron microscopy (EM) applications. Lectures and hands-on lab sessions will show how a complete in-situ system can optimize data management and reveal critical details in reactionprocesses. Specifically, temperature-induced transitions in both complex oxide materials and 2-dimensional MXene will be studied. Chemical and electronic transitions will be measured with direct detection electron energy loss spectroscopy (EELS), then correlated with the sample IV behavior. The in-situ system on a JEOL JEM 2100F STEM will feature:
  • GIF Quantum® energy filter with K2® IS direct detection camera
  • DENS solutions Lightning biasing & heating in-situ holder
  • In-Situ Explorer software
The workshop is complimentary to all confirmed registrants.
Space is limited. Please register by October 2, 2017.
Contact Information:
Name: Leslie Campion
Phone: 215.895.2322
Email: lca47@drexel.edu
Attachments For This Event:
    > In-Situ workshop program
Mitchell Auditorium
Bossone Research Center, 1st Floor
3140 Market St
  • Graduate Students
  • Faculty
  • Special Features:
  • Free Food

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