Start Date: | 9/27/2018 | Start Time: | 11:30 AM |
End Date: | 9/27/2018 | End Time: | 1:30 PM |
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Event Description
Physical Defects
and Degradation Mechanisms of GaN-based Electronic Devices Explored by
Transmission Electron Microscopy
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Location: Hill Conference Room, LeBow Engineering Center, 240 |
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